Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy
Author: Yasuo Cho
Publsiher: Woodhead Publishing
Total Pages: 256
Release: 2020-05-20
ISBN 10: 0081028032
ISBN 13: 9780081028032
Language: EN, FR, DE, ES & NL

Scanning Nonlinear Dielectric Microscopy Book Review:

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Local Deep Level Transient Spectroscopy Using Super higher order Scanning Nonlinear Dielectric Microscopy

Local Deep Level Transient Spectroscopy Using Super higher order Scanning Nonlinear Dielectric Microscopy
Author: Anonim
Publsiher: Unknown
Total Pages: 135
Release: 2016
ISBN 10: 1928374650XXX
ISBN 13: OCLC:1052023858
Language: EN, FR, DE, ES & NL

Local Deep Level Transient Spectroscopy Using Super higher order Scanning Nonlinear Dielectric Microscopy Book Review:

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
Author: Marin Alexe,Alexei Gruverman
Publsiher: Springer Science & Business Media
Total Pages: 282
Release: 2013-03-09
ISBN 10: 3662089017
ISBN 13: 9783662089019
Language: EN, FR, DE, ES & NL

Nanoscale Characterisation of Ferroelectric Materials Book Review:

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy  Characterization  Nanofabrication and Device Application of Functional Materials
Author: Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publsiher: Springer Science & Business Media
Total Pages: 488
Release: 2006-03-30
ISBN 10: 1402030193
ISBN 13: 9781402030192
Language: EN, FR, DE, ES & NL

Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials Book Review:

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy
Author: Seizo Morita
Publsiher: Springer Science & Business Media
Total Pages: 201
Release: 2006-12-30
ISBN 10: 3540343156
ISBN 13: 9783540343158
Language: EN, FR, DE, ES & NL

Roadmap of Scanning Probe Microscopy Book Review:

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Innovative Graphene Technologies

Innovative Graphene Technologies
Author: Atul Tiwari
Publsiher: Smithers Rapra
Total Pages: 540
Release: 2013-09-02
ISBN 10: 1909030236
ISBN 13: 9781909030237
Language: EN, FR, DE, ES & NL

Innovative Graphene Technologies Book Review:

Graphene has already gained a unique reputation among novel synthetic materials. Dedicated efforts and enormous resources are being invested in creating viable commercial products. The high electrical and thermal conductivities in graphene are well known, and most of the applications of this material are pivoted to these properties. In addition to electronic and thermal management applications there are several other vital areas where graphene can be used successfully. This book is compiled in two volumes. Volume 1 is specifically meant for beginners who want to know the science and technology associated with this nanomaterial. This volume consists of chapters that are specifically written for readers who are looking for the applications of graphene and its derivatives. The first objective of this book is to provide readers with numerical/physics based models for assessment of graphene for targeted applications. The second objective of this book is to introduce readers to the industrial applications of graphene. Chapters are carefully written so that readers can choose methodologies for screening of graphene materials for a particular application. This second volume is written for broader readership including young scholars and researchers with diverse backgrounds such as chemistry, physics, materials science, and engineering. It can be used as a textbook for graduate students, and also as a review or reference book for researchers from different branches of materials science.

Applied Scanning Probe Methods X

Applied Scanning Probe Methods X
Author: Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publsiher: Springer Science & Business Media
Total Pages: 427
Release: 2007-12-20
ISBN 10: 3540740856
ISBN 13: 9783540740858
Language: EN, FR, DE, ES & NL

Applied Scanning Probe Methods X Book Review:

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Polar Oxides

Polar Oxides
Author: Rainer Waser,Ulrich Böttger,Stephan Tiedke
Publsiher: John Wiley & Sons
Total Pages: 391
Release: 2006-03-06
ISBN 10: 3527604898
ISBN 13: 9783527604890
Language: EN, FR, DE, ES & NL

Polar Oxides Book Review:

Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review, discuss and assess the material properties with regard to new and advanced characterization and imaging techniques. For physicists, physicochemists, semiconductor and solid state physicists, materials scientists, and students of chemistry and physics.

Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics
Author: T. Mitch Wallis,Pavel Kabos
Publsiher: Cambridge University Press
Total Pages: 320
Release: 2017-09-30
ISBN 10: 1107120683
ISBN 13: 9781107120686
Language: EN, FR, DE, ES & NL

Measurement Techniques for Radio Frequency Nanoelectronics Book Review:

Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.

Ferroelectric Random Access Memories

Ferroelectric Random Access Memories
Author: Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
Publsiher: Springer Science & Business Media
Total Pages: 290
Release: 2004-04-16
ISBN 10: 9783540407188
ISBN 13: 3540407189
Language: EN, FR, DE, ES & NL

Ferroelectric Random Access Memories Book Review:

The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.

ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis

ISTFA 2019  Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author: Anonim
Publsiher: ASM International
Total Pages: 540
Release: 2019-12-01
ISBN 10: 1627082735
ISBN 13: 9781627082730
Language: EN, FR, DE, ES & NL

ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis Book Review:

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Ferroelectric Thin Films

Ferroelectric Thin Films
Author: Masanori Okuyama
Publsiher: Springer Science & Business Media
Total Pages: 244
Release: 2005-02-22
ISBN 10: 9783540241638
ISBN 13: 3540241639
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films Book Review:

Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Multifunctional Polycrystalline Ferroelectric Materials

Multifunctional Polycrystalline Ferroelectric Materials
Author: Lorena Pardo,Jesús Ricote
Publsiher: Springer Science & Business Media
Total Pages: 782
Release: 2011-02-14
ISBN 10: 9789048128754
ISBN 13: 9048128757
Language: EN, FR, DE, ES & NL

Multifunctional Polycrystalline Ferroelectric Materials Book Review:

This book presents selected topics on processing and properties of ferroelectric materials that are currently the focus of attention in scientific and technical research. Ferro-piezoelectric ceramics are key materials in devices for many applications, such as automotive, healthcare and non-destructive testing. As they are polycrystalline, non-centrosymmetric materials, their piezoelectricity is induced by the so-called poling process. This is based on the principle of polarization reversal by the action of an electric field that characterizes the ferroelectric materials. This book was born with the aim of increasing the awareness of the multifunctionality of ferroelectric materials among different communities, such as researchers, electronic engineers, end-users and manufacturers, working on and with ferro-piezoelectric ceramic materials and devices which are based on them. The initiative to write this book comes from a well-established group of researchers at the Laboratories of Ferroelectric Materials, Materials Science Institute of Madrid (ICMM-CSIC). This group has been working in different areas concerning thin films and bulk ceramic materials since the mid-1980s. It is a partner of the Network of Excellence on Multifunctional and Integrated Piezoelectric Devices (MIND) of the EC, in which the European Institute of Piezoelectric Materials and Devices has its origin.

ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis

ISTFA 2018  Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author: Anonim
Publsiher: ASM International
Total Pages: 135
Release: 2018-12-01
ISBN 10: 1627080996
ISBN 13: 9781627080996
Language: EN, FR, DE, ES & NL

ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis Book Review:

The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

Scanning Probe Microscopy of Functional Materials

Scanning Probe Microscopy of Functional Materials
Author: Sergei V. Kalinin,Alexei Gruverman
Publsiher: Springer Science & Business Media
Total Pages: 555
Release: 2010-12-13
ISBN 10: 9781441971678
ISBN 13: 144197167X
Language: EN, FR, DE, ES & NL

Scanning Probe Microscopy of Functional Materials Book Review:

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Microwave Superconductivity

Microwave Superconductivity
Author: H. Weinstock,Martin Nisenoff
Publsiher: Springer Science & Business Media
Total Pages: 618
Release: 2012-12-06
ISBN 10: 9401004501
ISBN 13: 9789401004503
Language: EN, FR, DE, ES & NL

Microwave Superconductivity Book Review:

Detailed coverage of all aspects of microwave superconductivity: fundamentals, fabrication, measurement, components, circuits, cryogenic packaging and market potential. Both a graduate-level textbook and a reference for microwave engineers. Applications (with either active or passive circuit elements) include those at both liquid-helium and liquid-nitrogen temperatures. Topics covered include wireless communications, space-based cryoelectronics, SQUIDs and SQUID amplifiers, NMR and MRI coils, accelerator cavities, and Josephson flux-flow devices.

Handbook of Microwave and Radar Engineering

Handbook of Microwave and Radar Engineering
Author: Anatoly Belous
Publsiher: Springer Nature
Total Pages: 973
Release: 2021-01-04
ISBN 10: 3030586995
ISBN 13: 9783030586997
Language: EN, FR, DE, ES & NL

Handbook of Microwave and Radar Engineering Book Review:

This comprehensive handbook provides readers with a single-source reference to the theoretical fundamentals, physical mechanisms and principles of operation of all known microwave devices and various radars. The author discusses proven methods of computation and design development, process, schematic, schematic-technical and construction peculiarities of each breed of the microwave devices, as well as the most popular and original technical solutions for radars. Coverage also includes the history of creation of the most widely used radars, as well as guidelines for their potential upgrading. Offers readers a comprehensive, systematized view of all contemporary knowledge, acquired during the last 20 years, on radars and related disciplines; Provides a single-source reference on the physical mechanisms and principles of operation of the basic components of radio location devices, including theoretical aspects of designing the necessary, high-efficiency electronic devices and systems, as well as key, practical methods of computation and design; Presents complex topics using simple language, minimizing mathematics.

Memory Mass Storage

Memory Mass Storage
Author: Giovanni Campardo,Federico Tiziani,Massimo Iaculo
Publsiher: Springer Science & Business Media
Total Pages: 479
Release: 2011-02-04
ISBN 10: 9783642147524
ISBN 13: 3642147526
Language: EN, FR, DE, ES & NL

Memory Mass Storage Book Review:

Memory Mass Storage describes the fundamental storage technologies, like Semiconductor, Magnetic, Optical and Uncommon, detailing the main technical characteristics of the storage devices. It deals not only with semiconductor and hard disk memory, but also with different ways to manufacture and assembly them, and with their application to meet market requirements. It also provides an introduction to the epistemological issues arising in defining the process of remembering, as well as an overview on human memory, and an interesting excursus about biological memories and their organization, to better understand how the best memory we have, our brain, is able to imagine and design memory.

Electrical Atomic Force Microscopy for Nanoelectronics

Electrical Atomic Force Microscopy for Nanoelectronics
Author: Umberto Celano
Publsiher: Springer
Total Pages: 408
Release: 2019-08-01
ISBN 10: 3030156125
ISBN 13: 9783030156121
Language: EN, FR, DE, ES & NL

Electrical Atomic Force Microscopy for Nanoelectronics Book Review:

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

Handbook of Advanced Dielectric Piezoelectric and Ferroelectric Materials

Handbook of Advanced Dielectric  Piezoelectric and Ferroelectric Materials
Author: Z-G Ye
Publsiher: Elsevier
Total Pages: 1096
Release: 2008-03-20
ISBN 10: 1845694007
ISBN 13: 9781845694005
Language: EN, FR, DE, ES & NL

Handbook of Advanced Dielectric Piezoelectric and Ferroelectric Materials Book Review:

This comprehensive book covers recent developments in advanced dielectric, piezoelectric and ferroelectric materials. Dielectric materials such as ceramics are used to manufacture microelectronic devices. Piezoelectric components have been used for many years in radioelectrics, time-keeping and, more recently, in microprocessor-based devices. Ferroelectric materials are widely used in various devices such as piezoelectric/electrostrictive transducers and actuators, pyroelectric infrared detectors, optical integrated circuits, optical data storage and display devices. The book is divided into eight parts under the general headings: High strain high performance piezo- and ferroelectric single crystals; Electric field-induced effects and domain engineering; Morphotropic phase boundary related phenomena; High power piezoelectric and microwave dielectric materials; Nanoscale piezo- and ferroelectrics; Piezo- and ferroelectric films; Novel processing and new materials; Novel properties of ferroelectrics and related materials. Each chapter looks at key recent research on these materials, their properties and potential applications. Advanced dielectric, piezoelectric and ferroelectric materials is an important reference tool for all those working in the area of electrical and electronic materials in general and dielectrics, piezoelectrics and ferroelectrics in particular. Covers the latest developments in advanced dielectric, piezoelectric and ferroelectric materials Includes topics such as high strain high performance piezo and ferroelectric single crystals Discusses novel processing and new materials, and novel properties of ferroelectrics and related materials