Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy
Author: Yasuo Cho
Publsiher: Woodhead Publishing
Total Pages: 256
Release: 2020-05-20
ISBN 10: 0081028032
ISBN 13: 9780081028032
Language: EN, FR, DE, ES & NL

Scanning Nonlinear Dielectric Microscopy Book Review:

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Ferroelectric Thin Films

Ferroelectric Thin Films
Author: Masanori Okuyama
Publsiher: Springer Science & Business Media
Total Pages: 244
Release: 2005-02-22
ISBN 10: 9783540241638
ISBN 13: 3540241639
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films Book Review:

Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
Author: Marin Alexe,Alexei Gruverman
Publsiher: Springer Science & Business Media
Total Pages: 282
Release: 2013-03-09
ISBN 10: 3662089017
ISBN 13: 9783662089019
Language: EN, FR, DE, ES & NL

Nanoscale Characterisation of Ferroelectric Materials Book Review:

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy
Author: Seizo Morita
Publsiher: Springer Science & Business Media
Total Pages: 201
Release: 2006-12-30
ISBN 10: 3540343156
ISBN 13: 9783540343158
Language: EN, FR, DE, ES & NL

Roadmap of Scanning Probe Microscopy Book Review:

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy  Characterization  Nanofabrication and Device Application of Functional Materials
Author: Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publsiher: Springer Science & Business Media
Total Pages: 488
Release: 2006-03-30
ISBN 10: 1402030193
ISBN 13: 9781402030192
Language: EN, FR, DE, ES & NL

Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials Book Review:

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

JJAP

JJAP
Author: Anonim
Publsiher: Unknown
Total Pages: 329
Release: 2001
ISBN 10:
ISBN 13: UVA:X006103296
Language: EN, FR, DE, ES & NL

JJAP Book Review:

Japanese Journal of Applied Physics

Japanese Journal of Applied Physics
Author: Anonim
Publsiher: Unknown
Total Pages: 329
Release: 2000
ISBN 10:
ISBN 13: UOM:39015050427387
Language: EN, FR, DE, ES & NL

Japanese Journal of Applied Physics Book Review:

Proceedings of the IEEE Conference on Nanotechnology

Proceedings of the     IEEE Conference on Nanotechnology
Author: Anonim
Publsiher: Unknown
Total Pages: 329
Release: 2002
ISBN 10:
ISBN 13: UOM:39015048307493
Language: EN, FR, DE, ES & NL

Proceedings of the IEEE Conference on Nanotechnology Book Review:

Ferroelectric Random Access Memories

Ferroelectric Random Access Memories
Author: Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
Publsiher: Springer Science & Business Media
Total Pages: 290
Release: 2004-04-16
ISBN 10: 9783540407188
ISBN 13: 3540407189
Language: EN, FR, DE, ES & NL

Ferroelectric Random Access Memories Book Review:

The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.

Ferroelectric Thin Films IX

Ferroelectric Thin Films IX
Author: Paul Cameron McIntyre
Publsiher: Unknown
Total Pages: 517
Release: 2001
ISBN 10:
ISBN 13: UCSD:31822031306335
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films IX Book Review:

Ferroelectric Thin Films

Ferroelectric Thin Films
Author: Anonim
Publsiher: Unknown
Total Pages: 329
Release: 2003
ISBN 10:
ISBN 13: UOM:39015047913945
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films Book Review:

Label Free Super Resolution Microscopy

Label Free Super Resolution Microscopy
Author: Vasily Astratov
Publsiher: Springer Nature
Total Pages: 487
Release: 2019-08-31
ISBN 10: 3030217221
ISBN 13: 9783030217228
Language: EN, FR, DE, ES & NL

Label Free Super Resolution Microscopy Book Review:

This book presents the advances in super-resolution microscopy in physics and biomedical optics for nanoscale imaging. In the last decade, super-resolved fluorescence imaging has opened new horizons in improving the resolution of optical microscopes far beyond the classical diffraction limit, leading to the Nobel Prize in Chemistry in 2014. This book represents the first comprehensive review of a different type of super-resolved microscopy, which does not rely on using fluorescent markers. Such label-free super-resolution microscopy enables potentially even broader applications in life sciences and nanoscale imaging, but is much more challenging and it is based on different physical concepts and approaches. A unique feature of this book is that it combines insights into mechanisms of label-free super-resolution with a vast range of applications from fast imaging of living cells to inorganic nanostructures. This book can be used by researchers in biological and medical physics. Due to its logically organizational structure, it can be also used as a teaching tool in graduate and upper-division undergraduate-level courses devoted to super-resolved microscopy, nanoscale imaging, microscopy instrumentation, and biomedical imaging.

Polar Oxides

Polar Oxides
Author: Rainer Waser,Ulrich Böttger,Stephan Tiedke
Publsiher: John Wiley & Sons
Total Pages: 391
Release: 2006-03-06
ISBN 10: 3527604898
ISBN 13: 9783527604890
Language: EN, FR, DE, ES & NL

Polar Oxides Book Review:

Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review, discuss and assess the material properties with regard to new and advanced characterization and imaging techniques. For physicists, physicochemists, semiconductor and solid state physicists, materials scientists, and students of chemistry and physics.

IEICE Transactions on Electronics

IEICE Transactions on Electronics
Author: Anonim
Publsiher: Unknown
Total Pages: 329
Release: 2005
ISBN 10:
ISBN 13: UCSD:31822033918988
Language: EN, FR, DE, ES & NL

IEICE Transactions on Electronics Book Review:

Fundamentals of Light Microscopy and Electronic Imaging

Fundamentals of Light Microscopy and Electronic Imaging
Author: Douglas B. Murphy,Michael W. Davidson
Publsiher: John Wiley & Sons
Total Pages: 552
Release: 2012-08-22
ISBN 10: 1118382935
ISBN 13: 9781118382936
Language: EN, FR, DE, ES & NL

Fundamentals of Light Microscopy and Electronic Imaging Book Review:

Fundamentals of Light Microscopy and Electronic Imaging, Second Edition provides a coherent introduction to the principles and applications of the integrated optical microscope system, covering both theoretical and practical considerations. It expands and updates discussions of multi-spectral imaging, intensified digital cameras, signal colocalization, and uses of objectives, and offers guidance in the selection of microscopes and electronic cameras, as well as appropriate auxiliary optical systems and fluorescent tags. The book is divided into three sections covering optical principles in diffraction and image formation, basic modes of light microscopy, and components of modern electronic imaging systems and image processing operations. Each chapter introduces relevant theory, followed by descriptions of instrument alignment and image interpretation. This revision includes new chapters on live cell imaging, measurement of protein dynamics, deconvolution microscopy, and interference microscopy. PowerPoint slides of the figures as well as other supplementary materials for instructors are available at a companion website: www.wiley.com/go/murphy/lightmicroscopy

Annual Review of Materials Research

Annual Review of Materials Research
Author: Anonim
Publsiher: Unknown
Total Pages: 329
Release: 2008
ISBN 10:
ISBN 13: UOM:39076002737984
Language: EN, FR, DE, ES & NL

Annual Review of Materials Research Book Review:

17th IEEE international conference on micro electro mechanical systems

17th IEEE international conference on micro electro mechanical systems
Author: IEEE International Conference on Micro Electro Mechanical Systems 17, 2004, Maastricht, The Netherlands
Publsiher: Unknown
Total Pages: 868
Release: 2004
ISBN 10: 9780780382657
ISBN 13: 078038265X
Language: EN, FR, DE, ES & NL

17th IEEE international conference on micro electro mechanical systems Book Review:

Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics
Author: T. Mitch Wallis,Pavel Kabos
Publsiher: Cambridge University Press
Total Pages: 320
Release: 2017-09-30
ISBN 10: 1107120683
ISBN 13: 9781107120686
Language: EN, FR, DE, ES & NL

Measurement Techniques for Radio Frequency Nanoelectronics Book Review:

Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Author: Bharat Bhushan
Publsiher: Springer Science & Business Media
Total Pages: 630
Release: 2012-10-24
ISBN 10: 3642254144
ISBN 13: 9783642254147
Language: EN, FR, DE, ES & NL

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 Book Review:

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Ferroelectric Thin Films XII Volume 784

Ferroelectric Thin Films XII  Volume 784
Author: Materials Research Society. Meeting
Publsiher: Unknown
Total Pages: 583
Release: 2004-04-09
ISBN 10:
ISBN 13: UCSD:31822033618430
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films XII Volume 784 Book Review:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2004, offers scientific and technological information on ferroelectric thin films from an international mix of academia, industry and government organizations.