Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy
Author: Yasuo Cho
Publsiher: Woodhead Publishing
Total Pages: 256
Release: 2020-05-20
ISBN 10: 0081028032
ISBN 13: 9780081028032
Language: EN, FR, DE, ES & NL

Scanning Nonlinear Dielectric Microscopy Book Review:

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
Author: Marin Alexe,Alexei Gruverman
Publsiher: Springer Science & Business Media
Total Pages: 282
Release: 2013-03-09
ISBN 10: 3662089017
ISBN 13: 9783662089019
Language: EN, FR, DE, ES & NL

Nanoscale Characterisation of Ferroelectric Materials Book Review:

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy
Author: Seizo Morita
Publsiher: Springer Science & Business Media
Total Pages: 201
Release: 2006-12-30
ISBN 10: 3540343156
ISBN 13: 9783540343158
Language: EN, FR, DE, ES & NL

Roadmap of Scanning Probe Microscopy Book Review:

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Author: Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
Publsiher: Springer Science & Business Media
Total Pages: 488
Release: 2006-03-30
ISBN 10: 1402030193
ISBN 13: 9781402030192
Language: EN, FR, DE, ES & NL

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Book Review:

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Applied Scanning Probe Methods X

Applied Scanning Probe Methods X
Author: Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publsiher: Springer Science & Business Media
Total Pages: 427
Release: 2007-12-20
ISBN 10: 3540740856
ISBN 13: 9783540740858
Language: EN, FR, DE, ES & NL

Applied Scanning Probe Methods X Book Review:

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Ferroelectric Random Access Memories

Ferroelectric Random Access Memories
Author: Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
Publsiher: Springer Science & Business Media
Total Pages: 290
Release: 2004-04-16
ISBN 10: 9783540407188
ISBN 13: 3540407189
Language: EN, FR, DE, ES & NL

Ferroelectric Random Access Memories Book Review:

The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.

Polar Oxides

Polar Oxides
Author: Rainer Waser,Ulrich Böttger,Stephan Tiedke
Publsiher: John Wiley & Sons
Total Pages: 391
Release: 2006-03-06
ISBN 10: 3527604898
ISBN 13: 9783527604890
Language: EN, FR, DE, ES & NL

Polar Oxides Book Review:

Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review, discuss and assess the material properties with regard to new and advanced characterization and imaging techniques. For physicists, physicochemists, semiconductor and solid state physicists, materials scientists, and students of chemistry and physics.

JJAP

JJAP
Author: Anonim
Publsiher: Anonim
Total Pages: 329
Release: 2001
ISBN 10:
ISBN 13: UVA:X006103296
Language: EN, FR, DE, ES & NL

JJAP Book Review:

Japanese Journal of Applied Physics

Japanese Journal of Applied Physics
Author: Anonim
Publsiher: Anonim
Total Pages: 329
Release: 2007
ISBN 10:
ISBN 13: UCSD:31822036019248
Language: EN, FR, DE, ES & NL

Japanese Journal of Applied Physics Book Review:

Ferroelectric Thin Films

Ferroelectric Thin Films
Author: Masanori Okuyama
Publsiher: Springer Science & Business Media
Total Pages: 244
Release: 2005-02-22
ISBN 10: 9783540241638
ISBN 13: 3540241639
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films Book Review:

Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Domains in Ferroic Crystals and Thin Films

Domains in Ferroic Crystals and Thin Films
Author: Alexander Tagantsev,L. Eric Cross,Jan Fousek
Publsiher: Springer Science & Business Media
Total Pages: 822
Release: 2011-03-02
ISBN 10: 1441914226
ISBN 13: 9781441914224
Language: EN, FR, DE, ES & NL

Domains in Ferroic Crystals and Thin Films Book Review:

At present, the marketplace for professionals, researchers, and graduate students in solid-state physics and materials science lacks a book that presents a comprehensive discussion of ferroelectrics and related materials in a form that is suitable for experimentalists and engineers. This book proposes to present a wide coverage of domain-related issues concerning these materials. This coverage includes selected theoretical topics (which are covered in the existing literature) in addition to a plethora of experimental data which occupies over half of the book. The book presents experimental findings and theoretical understanding of ferroic (non-magnetic) domains developed during the past 60 years. It addresses the situation by looking specifically at bulk crystals and thin films, with a particular focus on recently-developed microelectronic applications and methods for observations of domains with techniques such as scanning force microscopy, polarized light microscopy, scanning optical microscopy, electron microscopy, and surface decorating techniques. "Domains in Ferroic Crystals and Thin Films" covers a large area of material properties and effects connected with static and dynamic properties of domains, which are extremely relevant to materials referred to as ferroics. In other textbooks on solid state physics, one large group of ferroics is customarily covered: those in which magnetic properties play a dominant role. Numerous books are specifically devoted to magnetic ferroics and cover a wide spectrum of magnetic domain phenomena. In contrast, "Domains in Ferroic Crystals and Thin Films" concentrates on domain-related phenomena in nonmagnetic ferroics. These materials are still inadequately represented in solid state physics textbooks and monographs.

Proceedings of the ... IEEE Conference on Nanotechnology

Proceedings of the ... IEEE Conference on Nanotechnology
Author: Anonim
Publsiher: Anonim
Total Pages: 329
Release: 2002
ISBN 10:
ISBN 13: UOM:39015048307493
Language: EN, FR, DE, ES & NL

Proceedings of the ... IEEE Conference on Nanotechnology Book Review:

Ferroelectric Thin Films IX

Ferroelectric Thin Films IX
Author: Paul Cameron McIntyre
Publsiher: Anonim
Total Pages: 517
Release: 2001
ISBN 10:
ISBN 13: UCSD:31822031306335
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films IX Book Review:

Ferroelectric Thin Films

Ferroelectric Thin Films
Author: Anonim
Publsiher: Anonim
Total Pages: 329
Release: 2005
ISBN 10:
ISBN 13: UVA:X004773504
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films Book Review:

Advanced Data Storage Materials and Characterization Techniques: Volume 803

Advanced Data Storage Materials and Characterization Techniques: Volume 803
Author: Andrei Mijiritskii
Publsiher: Anonim
Total Pages: 280
Release: 2004-04-28
ISBN 10:
ISBN 13: UOM:39015061343417
Language: EN, FR, DE, ES & NL

Advanced Data Storage Materials and Characterization Techniques: Volume 803 Book Review:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Emerging Nanoelectronic Devices

Emerging Nanoelectronic Devices
Author: An Chen,James Hutchby,Victor Zhirnov,George Bourianoff
Publsiher: John Wiley & Sons
Total Pages: 576
Release: 2014-11-26
ISBN 10: 1118958276
ISBN 13: 9781118958278
Language: EN, FR, DE, ES & NL

Emerging Nanoelectronic Devices Book Review:

Emerging Nanoelectronic Devices focuses on the future direction of semiconductor and emerging nanoscale device technology. As the dimensional scaling of CMOS approaches its limits, alternate information processing devices and microarchitectures are being explored to sustain increasing functionality at decreasing cost into the indefinite future. This is driving new paradigms of information processing enabled by innovative new devices, circuits, and architectures, necessary to support an increasingly interconnected world through a rapidly evolving internet. This original title provides a fresh perspective on emerging research devices in 26 up to date chapters written by the leading researchers in their respective areas. It supplements and extends the work performed by the Emerging Research Devices working group of the International Technology Roadmap for Semiconductors (ITRS). Key features: • Serves as an authoritative tutorial on innovative devices and architectures that populate the dynamic world of “Beyond CMOS” technologies. • Provides a realistic assessment of the strengths, weaknesses and key unknowns associated with each technology. • Suggests guidelines for the directions of future development of each technology. • Emphasizes physical concepts over mathematical development. • Provides an essential resource for students, researchers and practicing engineers.

Ferroelectric Thin Films X:

Ferroelectric Thin Films X:
Author: Stephen R. Gilbert
Publsiher: Materials Research Society
Total Pages: 424
Release: 2002-05-01
ISBN 10:
ISBN 13: UCSD:31822031649387
Language: EN, FR, DE, ES & NL

Ferroelectric Thin Films X: Book Review:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Nanoscale Phenomena in Ferroelectric Thin Films

Nanoscale Phenomena in Ferroelectric Thin Films
Author: Seungbum Hong
Publsiher: Springer Science & Business Media
Total Pages: 288
Release: 2004-01-31
ISBN 10: 9781402076305
ISBN 13: 1402076304
Language: EN, FR, DE, ES & NL

Nanoscale Phenomena in Ferroelectric Thin Films Book Review:

This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.

Dekker Encyclopedia of Nanoscience and Nanotechnology

Dekker Encyclopedia of Nanoscience and Nanotechnology
Author: James A. Schwarz,Cristian I. Contescu,Karol Putyera
Publsiher: CRC Press
Total Pages: 4014
Release: 2004
ISBN 10: 9780824750503
ISBN 13: 0824750500
Language: EN, FR, DE, ES & NL

Dekker Encyclopedia of Nanoscience and Nanotechnology Book Review:

Digest of Technical Papers

Digest of Technical Papers
Author: Anonim
Publsiher: Anonim
Total Pages: 329
Release: 2005
ISBN 10:
ISBN 13: UOM:39015058782882
Language: EN, FR, DE, ES & NL

Digest of Technical Papers Book Review: