Reliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices
Author: Robert Herrick,Osamu Ueda
Publsiher: Woodhead Publishing
Total Pages: 334
Release: 2021-03-06
ISBN 10: 0128192550
ISBN 13: 9780128192559
Language: EN, FR, DE, ES & NL

Reliability of Semiconductor Lasers and Optoelectronic Devices Book Review:

Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies. This book is suitable for new entrants to the field of optoelectronics working in R&D. • Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry • Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products. • Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more.

Semiconductor Laser Engineering Reliability and Diagnostics

Semiconductor Laser Engineering  Reliability and Diagnostics
Author: Peter W. Epperlein
Publsiher: John Wiley & Sons
Total Pages: 522
Release: 2013-03-18
ISBN 10: 1119990335
ISBN 13: 9781119990338
Language: EN, FR, DE, ES & NL

Semiconductor Laser Engineering Reliability and Diagnostics Book Review:

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues; detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application; systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers; coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany. Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world’s first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers. Book Reviews “Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices”. By Peter W. Epperlein Prof. em. Dr. Heinz Jäckel, High Speed Electronics and Photonics, Swiss Federal Institute of Technology ETH Zürich, Switzerland The book “Semiconductor Laser Engineering, Reliability and Diagnostics” by Dr. P.W. Epperlein is a landmark in the recent literature on semiconductor lasers because it fills a longstanding gap between many excellent books on laser theory and the complex and challenging endeavor to fabricate these devices reproducibly and reliably in an industrial, real world environment. Having worked myself in the early research and development of high power semiconductor lasers, I appreciate the competent, complete and skillful presentation of these three highly interrelated topics, where small effects have dramatic consequences on the success of a final product, on the ultimate performance and on the stringent reliability requirements, which are the name of the game. As the title suggests the author addresses three tightly interwoven and critical topics of state-of-the-art power laser research. The three parts are: device and mode stability engineering (chapter 1, 2), reliability mechanisms and reliability assessment strategies (chapter 3, 4, 5, 6) and finally material and device diagnostics (chapter 7, 8, 9) all treated with a strong focus on the implementation. This emphasis on the complex practical aspects for a large-scale power laser fabrication is a true highlight of the book. The subtle interplay between laser design, reliability strategies, advanced failure analysis and characterization techniques are elaborated in a very rigorous and scientific way using a very clear and easy to read representation of the complex interrelation of the three major topics. I will abstain from trying to provide a complete account of all the topics but mainly concentrate on the numerous highlights. The first part 1 “Laser Engineering” is divided in two chapters on basic electronic-optical, structural, material and resonator laser engineering on the one side, and on single mode control and stability at very high, still reliable power-levels with the trade-off between mirror damage, single mode stability on the other side. To round up the picture less well-known concepts and the state-of-the-art of large-area lasers, which can be forced into single-mode operation, are reviewed carefully. The subtle and complex interplay, which is challenging to optimize for a design for reliability and low stress as a major boundary condition is crucial for the design. The section gives a rather complete and well-referenced account of all relevant aspects, relations and trade-offs for understanding the rest of the book. The completeness of the presentation on power laser diode design based on basic physical and plausible arguments is mainly based on analytic mathematical relations as well as experiments providing a new and well-balanced addition for the power diode laser literature in particular. Modern 2D self-consistent electro-optical laser modeling including carrier hole burning and thermal effects – this is important because the weak optical guiding and gain-discrimination depend critically on rather small quantities and effects, which are difficult to optimize experimentally – is used in the book for simulation results, but is not treated separately. The novel and really original, “gap-filling” bulk of the book is elaborated by the author in a very clear way in the following four chapters in the part 2 “Laser Reliability” on laser degradation physics and mirror design and passivation at high power, followed then by two very application oriented chapters on reliability design engineering and practical reliability strategies and implementation procedures. This original combination of integral design and reliability aspects – which are mostly neglected in standard literature – is certainly a major plus of this book. I liked this second section as a whole, because it provides excellent insights in degradation physics on a high level and combines it in an interesting and skillful way with the less “glamorous” (unfortunately) but highly relevant reliability science and testing strategies, which is particularly important for devices operating at extreme optical stresses with challenging lifetime requirements in a real word environment. Finally, the last part 3 “Laser Diagnostics” comprising three chapters, is devoted mainly to advanced experimental diagnostics techniques for material integrity, mechanical stress, deep level defects, various dynamic laser degradation effects, surface- and interface quality, and most importantly heating and disordering of mirrors and mirror coatings. The topics of characterization techniques comprising micro-Raman- and micro-thermoreflectance-probing, 2K photoluminescence spectroscopy, micro-electroluminescence and photoluminescence scanning, and deep-level-transient spectroscopy have been pioneered by the author for the specific applications over many years guaranteeing many competent and well represented insights. These techniques are brilliantly discussed and the information distributed in many articles by the author has been successfully unified in a book form. In my personal judgment and liking, I consider the parts 2 and 3 on reliability and diagnostics as the most valuable and true novel contribution of the book, which in combination with the extremely well-covered laser design of part 1 clearly fill the gap in the current diode laser literature, which in this detail has certainly been neglected in the past. In summary, I can highly recommend this excellent, well-organized and clearly written book to readers who are already familiar with basic diode laser theory and who are active in the academic and industrial fabrication and characterization of semiconductor lasers. Due to its completeness, it also serves as an excellent reference of the current state-of-the-art in reliability engineering and device and material diagnostics. Needless to mention that the quality of the book, its representations and methodical structure meet the highest expectation and are certainly a tribute from the long and broad experience of the author in academic laser science and the industrial commercialization of high power diode lasers. In my opinion, this book was a pleasure to read and due to its quality and relevance deserves a large audience in the power diode laser community! Prof. em. Dr. Heinz Jäckel, High Speed Electronics and Photonics, Swiss Federal Institute of Technology ETH Zürich, Switzerland June 16, 2013 ========================================== “Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices”. By Peter W. Epperlein Dr. Chung-en Zah, Research Director, Semiconductor Technologies Research, S&T Division, Corning Incorporate, Corning NY, USA This book covers for the first time the three closely interrelated key laser areas of engineering (design), reliability and diagnostics in one book, written by the well-known practitioner in cutting-edge optoelectronics industries, Dr. Peter W. Epperlein. The book closes the gap in the current book literature and is thus a unique and excellent example of how to merge design, reliability and diagnostics aspects in a very professional, profound and complete manner. All physical and technological principles, concepts and practical aspects required for developing and fabricating highly-reliable high-power single-mode laser products are precisely specified and skilfully formulated along with all the necessary equations, figures, tables and worked-out examples making it easy to follow through the nine chapters. Hence, this unique book is a milestone in the diode laser literature and is an excellent reference book not only for diode laser researchers and engineers, but also diode laser users. The engineering part starts with a very informative and clear, well-presented account of all necessary basic diode laser types, principles, parameters and characteristics for an easy and quick understanding of laser functionality within the context of the book. Along with an elaborate and broad discussion of relevant laser material systems, applications, typical output powers, power-limiting factors and reliability tradeoffs, basic fabrication and packaging technologies, this excellent introductory section is well suited to become quickly and easily familiar with practical aspects and issues of diode laser technologies. Of special importance and high usefulness is the first analytic and quantitative discussion in a book on issues of coupling laser power into optical single mode fibers. The second section discusses in a well-balanced, competent and skilful way waveguide topics such as basic high-power design approaches, transverse vertical and lateral waveguide concepts, stability of the fundamental transverse lateral mode and fundamental mode waveguide optimization techniques by considering detrimental effects such as heating, carrier injection, spatial hole burning, lateral current spreading and gain profile variations. Less well-known approaches to force large-area lasers into a single mode operation are well-identified and carefully discussed in depth and breadth. All these topics are elaborated in a very complete, rigorous and scientific way and are clearly articulated and easy to read. In particular, the book works out the complex interaction between the many different effects to optimize high-power single-mode performance at ultimate reliability and thus is of great benefit to every researcher and engineer engaged in this diode laser field. Another novelty and highlight is, for the first time ever in book form, a comprehensive yet concise discussion of diode laser reliability related issues. These are elaborated in four distinct chapters comprising laser degradation physics and modes, optical strength enhancement approaches including mirror passivation/coating and non-absorbing mirror technologies, followed by two highly relevant product-oriented chapters on reliability design engineering concepts and techniques and an elaborate reliability test plan for laser chip and module product qualification. This original and novel approach to link laser design to reliability aspects and requirements provides both, most useful insight into degradation processes such as catastrophic optical mirror damage on a microscopic scale, and a wide selection of effective remedial actions. These accounts, which are of highest significance for lasers operating at the optical stress limit due to extremely high output power densities and most demanding lifetime requirements are very professionally prepared and discussed in an interesting, coherent and skilful manner. The diagnostics part, consisting of three very elaborate chapters, is most unique and novel with respect to other diode laser books. It discusses for the first time ever on a very high level and in a competent way studies on material integrity, impurity trapping effects, mirror and cavity temperatures, surface- and interface quality, mirror facet disorder effects, mechanical stress and facet coating instability, and diverse laser temperature effects, dynamic laser degradation effects and mirror temperature maps. Of highest significance to design, performance and reliability are the various correlations established between laser device and material parameters. The most different and sophisticated experiments, carried out by the author at micrometer spatial resolutions and at temperatures as low as 2K, provide highly valuable insights into laser and material quality parameters, and reveal for the first time the origins of high power limitations on an atomic scale due to local heating effects and deep level defects. It is of great benefit, that the experimental techniques such as Raman spectroscopy, various luminescence techniques, thermoreflectance and deep-level transient spectroscopy, pioneered by the author for the specific experiments on lasers, are discussed with great expertise in depth and breadth, and the numerous paper articles published by the author are now represented in this book. The book has an elaborate table of contents and index, which are very useful, over 200 illustrative figures and tables, and extensive lists of references to all technical topics at the end of each of the nine chapters, which make it easy to follow from cover to cover or by jumping in at random areas of special interest. Moreover, experimental and theoretical concepts are always illustrated by practical examples and data. I can highly recommend this extremely relevant, well-structured and well-formulated book to all practising researchers in industrial and academic diode laser R&D environments and to post-graduate engineering students interested in the actual problems of designing, manufacturing, testing, characterising and qualifying diode lasers. Due to its completeness and novel approach to combine design, reliability and diagnostics in the same book, it can serve as an ideal reference book as well, and it deserves to be welcomed wordwide by the addressed audience. Dr. Chung-en Zah, Research Director, Semiconductor Technologies Research, S&T Division, Corning Incorporate, Corning NY, USA =========================================== “Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices”. By Peter W. Epperlein Cordinatore Prof. Lorenzo Pavesi, UNIVERSITÀ DEGLI STUDI DI TRENTO, Dipartimento di Fisica / Laboratorio di Nanoscienze This book represents a well thought description of three fundamental aspects of laser technology: the functioning principles, the reliability and the diagnostics. From this point of view, and, as far as I know, this is a unique example of a book where all these aspects are merged together resulting in a well-balanced presentation. This helps the reader to move with ease between different concepts since they are presented in a coherent manner and with the same terminology, symbols and definitions. The book reads well. Despite the subtitle indicates that it is a practical approach, the book is also correct from a formal point of view and presents the necessary equations and derivations to understand both the physical mechanisms and the practicalities via a set of useful formulas. In addition, there is the more important aspect of many real-life examples of how a laser is actually manufactured and which the relevant parameters that determine its behaviour are. It impresses the amounts of information that are given in the book: this would be more typical of a thick handbook on semiconductor laser than of an agile book. Dr. Epperlein was able to identify the most important concepts and to present them in a clear though concise way. I am teaching a course on Optoelectronics and I'm going to advise students to refer to this book, because it has all the necessary concepts and derivations for a systematic understanding of semiconductor lasers with many worked-out examples, which will help the student to grasp the actual problems of designing, manufacturing, testing and using semiconductor lasers. All the various concepts are joined to very useful figures, which, if provided to instructors as files, can be a useful add-on for the use of the book as text for teaching. Concepts are always detailed with numbers to give a feeling of their practical use. In conclusion, I do find the book suitable for my teaching duties and will refer it to my students. Prof. Dr. Lorenzo Pavesi, Head of the Department of Physics, Head of the Nanoscience Laboratory, University of Trento, Italy 31 May 2013 =========================================== “Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices”. By Peter W. Epperlein Robert W. Herrick, Ph.D., Senior Component Reliability Engineer, Intel Corp., Santa Clara, California, USA Dr. Epperlein has done the semiconductor laser community a great service, by releasing the most complete book on the market on the practical issues of how to make reliable semiconductor lasers. While dozens of books have been written over the past couple of decades on semiconductor laser design, only a handful have been written on semiconductor laser reliability. Prior to the release of this book, perhaps 40% of the material could be obtained elsewhere by combining five books: one on laser design, one on laser reliability, one on reliability calculations, and a couple of laser review books. Another 40% could be pieced together by collecting 50 -100 papers on the subjects of laser design, laser fabrication, characterization, and reliability. The remaining 20% have not previously been covered in any comprehensive way. Only the introductory material in the first half of the first chapter has good coverage elsewhere. The large majority of the knowledge in this book is generally held as “trade secret” by those with the expertise in the field, and most of those in the know are not free to discuss. The author was fortunate enough to work for the first half of his career in the IBM research labs, with access to unparalleled resources, and the ability to publish his work without trade secret restrictions. The results are still at the cutting edge of our understanding of semiconductor laser reliability today, and go well beyond the empirical “black box” approach many use of “try everything, and see what works.” The author did a fine job of pulling together material from many disparate fields. Dr. Epperlein has particular expertise in high power single mode semiconductor lasers, and those working on those type of lasers will be especially interested in this book, as there has never been a book published on the fabrication and qualification of such lasers before. But those in almost any field of semiconductor lasers will learn items of interest about device design, fabrication, reliability, and characterization. Unlike most other books, which intend to convey the scientific findings or past work of the author, this one is written more as a “how to” manual, which should make it more accessible and useful to development engineers and researchers in the field. It also has over 200 figures, which make it easier to follow. As with many books of this type, it is not necessary to read it from cover-to-cover; it is best skimmed, with deep diving into any areas of special interest to the reader. The book is remarkable also for how comprehensive it is – even experts will discover something new and useful. Dr. Epperlein’s book is an essential read for anyone looking to develop semiconductor lasers for anything other than pure research use, and I give it my highest recommendation. Robert W. Herrick, Ph.D., Senior Component Reliability Engineer, Intel Corp., Santa Clara, California, USA

Reliability and Degradation of Semiconductor Lasers and LEDs

Reliability and Degradation of Semiconductor Lasers and LEDs
Author: Mitsuo Fukuda
Publsiher: Artech House on Demand
Total Pages: 343
Release: 1991-01-01
ISBN 10: 9780890064658
ISBN 13: 0890064652
Language: EN, FR, DE, ES & NL

Reliability and Degradation of Semiconductor Lasers and LEDs Book Review:

This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre communication. This book should prove of interest to engineers and scientists in research, design, manufacturing and development of semiconductor lasers, LEDs and optical transmission systems.

Semiconductor Device Reliability

Semiconductor Device Reliability
Author: A. Christou,B.A. Unger
Publsiher: Springer Science & Business Media
Total Pages: 575
Release: 2012-12-06
ISBN 10: 9400924828
ISBN 13: 9789400924826
Language: EN, FR, DE, ES & NL

Semiconductor Device Reliability Book Review:

This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.

Optoelectronic Devices

Optoelectronic Devices
Author: Dutta Niloy K,Zhang Xiang
Publsiher: World Scientific
Total Pages: 588
Release: 2013-09-30
ISBN 10: 981323671X
ISBN 13: 9789813236714
Language: EN, FR, DE, ES & NL

Optoelectronic Devices Book Review:

This book provides a comprehensive treatment of the design and applications of optoelectronic devices. Optoelectronic devices such as light emitting diodes (LEDs), semiconductor lasers, photodetectors, optical fibers, and solar cells, are important components for solid state lighting systems, optical communication systems, and power generation systems. Optical fiber amplifiers and fiber lasers are also important for high power industrial applications and sensors. The applications of optoelectronic devices were first studied in the 1970's. Since then, the diversity and scope of optoelectronic device research and applications have been steadily growing. Optoelectronic Devices is self-contained and unified in presentation. It can be used as an advanced textbook by graduate students and practicing engineers. It is also suitable for non-experts who wish to have an overview of optoelectronic devices and systems. The treatments in the book are detailed enough to capture the interest of the curious reader and complete enough to provide the necessary background to explore the subject further.

Reliability Characterisation of Electrical and Electronic Systems

Reliability Characterisation of Electrical and Electronic Systems
Author: Jonathan Swingler
Publsiher: Elsevier
Total Pages: 274
Release: 2014-12-24
ISBN 10: 1782422250
ISBN 13: 9781782422259
Language: EN, FR, DE, ES & NL

Reliability Characterisation of Electrical and Electronic Systems Book Review:

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation

Packaging of High Power Semiconductor Lasers

Packaging of High Power Semiconductor Lasers
Author: Xingsheng Liu,Wei Zhao,Lingling Xiong,Hui Liu
Publsiher: Springer
Total Pages: 402
Release: 2014-07-14
ISBN 10: 1461492637
ISBN 13: 9781461492634
Language: EN, FR, DE, ES & NL

Packaging of High Power Semiconductor Lasers Book Review:

This book introduces high power semiconductor laser packaging design. The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in detail.

Optical Semiconductor Devices

Optical Semiconductor Devices
Author: Mitsuo Fukuda
Publsiher: John Wiley & Sons
Total Pages: 440
Release: 1998-12-24
ISBN 10: 9780471149590
ISBN 13: 0471149594
Language: EN, FR, DE, ES & NL

Optical Semiconductor Devices Book Review:

This book is devoted to optical semiconductor devices and their numerous applications in telecommunications, optoelectronics, and consumer electronics-areas where signal processing or the transmission of signals across fiber optic cables is paramount. It introduces a new generation of devices that includes optical modulators, quantum well (QW) lasers, and photodiodes and explores new applications of more established devices such as semiconductor lasers, light-emitting diodes, and photodiodes. Mitsuo Fukuda examines the material properties, operation principles, fabrication, packaging, reliability, and applications of each device and offers a unique industrial perspective, discussing everything engineers and scientists need to know at different phases of research, development, and production. This guide to the state-of-the-art of optical semiconductor devices: * Helps you choose the right device for a given application. * Covers important performance data such as temperature and optical feedback noise in lasers. * Highlights epitaxial growth techniques and fabrication for each device. * Features one hundred figures and an extensive bibliography. * Provides a clear and concise treatment, unencumbered by excessive theory Optical Semiconductor Devices is an essential resource for engineers and researchers in telecommunications and optoelectronics, equipment designers and manufacturers, and graduate students and scholars interested in this rapidly evolving field.

Optimizing the Air Force Acquisition Strategy of Secure and Reliable Electronic Components

Optimizing the Air Force Acquisition Strategy of Secure and Reliable Electronic Components
Author: National Academies of Sciences, Engineering, and Medicine,Division on Engineering and Physical Sciences,Air Force Studies Board,Committee on Optimizing the Air Force Acquisition Strategy of Secure and Reliable Electronic Components: A Workshop
Publsiher: National Academies Press
Total Pages: 62
Release: 2016-09-12
ISBN 10: 0309445183
ISBN 13: 9780309445184
Language: EN, FR, DE, ES & NL

Optimizing the Air Force Acquisition Strategy of Secure and Reliable Electronic Components Book Review:

In 2012, the National Defense Authorization Act (NDAA), section 818, outlined new requirements for industry to serve as the lead in averting counterfeits in the defense supply chain. Subsequently, the House Armed Services Committee, in its report on the Fiscal Year 2016 NDAA, noted that the pending sale of IBM's microprocessor fabrication facilities to Global Foundries created uncertainty about future access of the United States to trusted state-of-the-art microelectronic components and directed the Comptroller General to assess the Department of Defense's (DoD's) actions and measures to address this threat. In this context, the National Academies of Sciences, Engineering, and Medicine convened a workshop to facilitate an open dialogue with leading industry, academic, and government experts to (1) define the current technological and policy challenges with maintaining a reliable and secure source of microelectronic components; (2) review the current state of acquisition processes within the Air Force for acquiring reliable and secure microelectronic components; and (3) explore options for possible business models within the national security complex that would be relevant for the Air Force acquisition community. This publication summarizes the results of the workshop.

Reliability and Radiation Effects in Compound Semiconductors

Reliability and Radiation Effects in Compound Semiconductors
Author: Anonim
Publsiher: Unknown
Total Pages: 135
Release: 2021
ISBN 10: 9814467650
ISBN 13: 9789814467650
Language: EN, FR, DE, ES & NL

Reliability and Radiation Effects in Compound Semiconductors Book Review:

Semiconductor Optoelectronic Device Manufacturing and Applications

Semiconductor Optoelectronic Device Manufacturing and Applications
Author: David Chen,Society of Photo-optical Instrumentation Engineers
Publsiher: Society of Photo Optical
Total Pages: 352
Release: 2001
ISBN 10: 1928374650XXX
ISBN 13: UOM:39015051619388
Language: EN, FR, DE, ES & NL

Semiconductor Optoelectronic Device Manufacturing and Applications Book Review:

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author: Osamu Ueda,Stephen J. Pearton
Publsiher: Springer Science & Business Media
Total Pages: 616
Release: 2012-09-22
ISBN 10: 1461443377
ISBN 13: 9781461443377
Language: EN, FR, DE, ES & NL

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices Book Review:

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

Microelectronics Failure Analysis

Microelectronics Failure Analysis
Author: EDFAS Desk Reference Committee
Publsiher: ASM International
Total Pages: 660
Release: 2011
ISBN 10: 1615037268
ISBN 13: 9781615037261
Language: EN, FR, DE, ES & NL

Microelectronics Failure Analysis Book Review:

Includes bibliographical references and index.

Microelectronics Failure Analysis

Microelectronics Failure Analysis
Author: Anonim
Publsiher: ASM International
Total Pages: 800
Release: 2004-01-01
ISBN 10: 0871708043
ISBN 13: 9780871708045
Language: EN, FR, DE, ES & NL

Microelectronics Failure Analysis Book Review:

For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron

Materials for Optoelectronic Devices OEICs and Photonics

Materials for Optoelectronic Devices  OEICs and Photonics
Author: H. Schlötterer,M. Quillec,P.D. Greene,M. Bertolotti
Publsiher: Elsevier
Total Pages: 542
Release: 1991-10-08
ISBN 10: 0444596755
ISBN 13: 9780444596758
Language: EN, FR, DE, ES & NL

Materials for Optoelectronic Devices OEICs and Photonics Book Review:

The aim of the contributions in this volume is to give a current overview on the basic properties and applications of semiconductor and nonlinear optical materials for optoelectronics and integrated optics. They provide a cross-linkage between different materials (III-V, II-VI, Si-Ge, glasses, etc.), various sample dimensions (from bulk crystals to quantum dots), and a range of techniques for growth (LPE to MOMBE) and for processing (from surface passivation to ion beams). Major growth techniques and materials are discussed, including the sophisticated technologies required to exploit the exciting properties of low dimensional semiconductors. These proceedings will prove an invaluable guide to the current state of optoelectronic and nonlinear optical materials development, as well as indicating trends and also future markets for optoelectronic devices.

Two dimensional Materials for Photodetector

Two dimensional Materials for Photodetector
Author: Pramoda Kumar Nayak
Publsiher: BoD – Books on Demand
Total Pages: 242
Release: 2018-04-04
ISBN 10: 9535139517
ISBN 13: 9789535139515
Language: EN, FR, DE, ES & NL

Two dimensional Materials for Photodetector Book Review:

Atomic thin two-dimensional (2D) materials are the thinnest forms of materials to ever occur in nature and have the potential to dramatically alter and revolutionize our material world. Some of the unique properties of these materials including wide photoresponse wavelength, passivated surfaces, strong interaction with incident light, and high mobility have created tremendous interest in photodetector application. This book provides a comprehensive state-of-the-art knowledge about photodetector technology in the range visible to infrared region using various 2D materials including graphene, transition metal dichalcogenides, III-V semiconductor, and so on. It consists of 10 chapters contributed by a team of experts in this exciting field. We believe that this book will provide new opportunities and guidance for the development of next-generation 2D photodetector.

Fiber Optics Engineering

Fiber Optics Engineering
Author: Mohammad Azadeh
Publsiher: Springer Science & Business Media
Total Pages: 376
Release: 2009-08-05
ISBN 10: 9781441903044
ISBN 13: 1441903046
Language: EN, FR, DE, ES & NL

Fiber Optics Engineering Book Review:

Within the past few decades, information technologies have been evolving at a tremendous rate, causing profound changes to our world and our ways of life. In particular, fiber optics has been playing an increasingly crucial role within the telecommunication revolution. Not only most long-distance links are fiber based, but optical fibers are increasingly approaching the individual end users, providing wide bandwidth links to support all kinds of data-intensive applications such as video, voice, and data services. As an engineering discipline, fiber optics is both fascinating and challenging. Fiber optics is an area that incorporates elements from a wide range of techno- gies including optics, microelectronics, quantum electronics, semiconductors, and networking. As a result of rapid changes in almost all of these areas, fiber optics is a fast evolving field. Therefore, the need for up-to-date texts that address this growing field from an interdisciplinary perspective persists. This book presents an overview of fiber optics from a practical, engineering perspective. Therefore, in addition to topics such as lasers, detectors, and optical fibers, several topics related to electronic circuits that generate, detect, and process the optical signals are covered. In other words, this book attempts to present fiber optics not so much in terms of a field of “optics” but more from the perspective of an engineering field within “optoelectronics.

Lasers and Optoelectronics

Lasers and Optoelectronics
Author: Anil K. Maini
Publsiher: John Wiley & Sons
Total Pages: 600
Release: 2013-08-05
ISBN 10: 1118688961
ISBN 13: 9781118688960
Language: EN, FR, DE, ES & NL

Lasers and Optoelectronics Book Review:

With emphasis on the physical and engineering principles, thisbook provides a comprehensive and highly accessible treatment ofmodern lasers and optoelectronics. Divided into four parts, itexplains laser fundamentals, types of lasers, laser electronics& optoelectronics, and laser applications, covering each of thetopics in their entirety, from basic fundamentals to advancedconcepts. Key features include: exploration of technological and application-related aspects oflasers and optoelectronics, detailing both existing and emergingapplications in industry, medical diagnostics and therapeutics,scientific studies and Defence. simple explanation of the concepts and essential information onelectronics and circuitry related to laser systems illustration of numerous solved and unsolved problems,practical examples, chapter summaries, self-evaluation exercises,and a comprehensive list of references for furtherreading This volume is a valuable design guide for R&D engineers andscientists engaged in design and development of lasers andoptoelectronics systems, and technicians in their operation andmaintenance. The tutorial approach serves as a useful reference forunder-graduate and graduate students of lasers and optoelectronics,also PhD students in electronics, optoelectronics and physics.

Semiconductor Laser Diode

Semiconductor Laser Diode
Author: Dnyaneshwar Patil
Publsiher: BoD – Books on Demand
Total Pages: 390
Release: 2012-04-25
ISBN 10: 9535105493
ISBN 13: 9789535105497
Language: EN, FR, DE, ES & NL

Semiconductor Laser Diode Book Review:

This book represents a unique collection of the latest developments in the rapidly developing world of semiconductor laser diode technology and applications. An international group of distinguished contributors have covered particular aspects and the book includes optimization of semiconductor laser diode parameters for fascinating applications. This collection of chapters will be of considerable interest to engineers, scientists, technologists and physicists working in research and development in the field of semiconductor laser diode, as well as to young researchers who are at the beginning of their career.

Advanced Laser Diode Reliability

Advanced Laser Diode Reliability
Author: Massimo Vanzi,Laurent Bechou,Mitsuo Fukuda,Giovanna Mura
Publsiher: Elsevier
Total Pages: 268
Release: 2021-07-30
ISBN 10: 0081010893
ISBN 13: 9780081010891
Language: EN, FR, DE, ES & NL

Advanced Laser Diode Reliability Book Review:

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. Talk about Natural continuity with the most widespread existing textbooks, published by Mitsuo Fukuda Present the extension to new failure mechanisms, new technologies, new application fields, new environments Introduce a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities