Atom Probe Tomography

Atom Probe Tomography
Author: Michael K. Miller
Publsiher: Springer Science & Business Media
Total Pages: 239
Release: 2012-12-06
ISBN 10: 1461542812
ISBN 13: 9781461542810
Language: EN, FR, DE, ES & NL

Atom Probe Tomography Book Review:

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Atom Probe Tomography

Atom Probe Tomography
Author: Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
Publsiher: Academic Press
Total Pages: 416
Release: 2016-05-30
ISBN 10: 0128047453
ISBN 13: 9780128047453
Language: EN, FR, DE, ES & NL

Atom Probe Tomography Book Review:

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Atom Probe Microscopy

Atom Probe Microscopy
Author: Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
Publsiher: Springer Science & Business Media
Total Pages: 396
Release: 2012-08-27
ISBN 10: 146143436X
ISBN 13: 9781461434368
Language: EN, FR, DE, ES & NL

Atom Probe Microscopy Book Review:

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
Author: David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
Publsiher: Springer Science & Business Media
Total Pages: 318
Release: 2013-12-12
ISBN 10: 1461487218
ISBN 13: 9781461487210
Language: EN, FR, DE, ES & NL

Local Electrode Atom Probe Tomography Book Review:

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

Atom Probe Tomography

Atom Probe Tomography
Author: Michael K. Miller,Richard G. Forbes
Publsiher: Springer
Total Pages: 423
Release: 2014-07-31
ISBN 10: 148997430X
ISBN 13: 9781489974303
Language: EN, FR, DE, ES & NL

Atom Probe Tomography Book Review:

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

Microstructural Geochronology

Microstructural Geochronology
Author: Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait
Publsiher: John Wiley & Sons
Total Pages: 402
Release: 2017-11-23
ISBN 10: 1119227356
ISBN 13: 9781119227359
Language: EN, FR, DE, ES & NL

Microstructural Geochronology Book Review:

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.

Atom Probe Tomography of Hard Nitride and Boride Thin Films

Atom Probe Tomography of Hard Nitride and Boride Thin Films
Author: David L. J. Engberg
Publsiher: Linköping University Electronic Press
Total Pages: 79
Release: 2019-08-02
ISBN 10: 9176850439
ISBN 13: 9789176850435
Language: EN, FR, DE, ES & NL

Atom Probe Tomography of Hard Nitride and Boride Thin Films Book Review:

Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. Mass spectral overlaps in TiSiN, which make 28Si indistinguishable from 14N, was resolved by isotopic substitution with 15N, and the nanostructural distribution of elements was thus revealed in 3-D, which enabled the identification of additional structural elements within the nanostructured Ti0.81Si0.1915N film. Improvements to the growth model of TiSiN by cathodic arc deposition was suggested. A self-organized nanolabyrinthine structure of ZrAlN, consisting of standing lamellae of fcc-ZrN and hexagonal AlN, was investigated with focus on the onset and limits of the self-organization. The local crystallographic orientational relationships were (001)ZrN || (0001)AlN and <110>ZrN || <2-1-10>AlN. Close to the MgO substrates, a smooth transition region was formed, going from segregated and disordered to the self-organized nanolabyrinthine structure. With increased growth temperature, coarse (111)-oriented ZrN grains occasionally precipitated and locally replaced the nanolabyrinthine structure. Significant local magnification effects rendered the Zr and N signals unusable, thereby inhibiting quantitative compositional analysis of the constituent phases, but the nanostructure was resolved using the Al signal. Ceramic materials are often affected by correlated evaporation, which can result in losses due to the detector dead-time/space. A compositional correction procedure was suggested, tested against an established procedure, and applied to ZrB2. The correction was found to be less dependent on the isotope abundances and background correction compared to the established procedure. While losses due to dead-time/space occur in atom probe tomography of all materials, the correlative field evaporation behavior of ceramics significantly increases the compositional error. The evaporation behavior of ZrB2 was therefore thoroughly investigated and evidence of preferential retention, correlated evaporation, and inhomogeneous field distributions at a low-index pole was presented. The high mass resolution, relatively low multiple events percentage, and quality of the co-evaporation correlation data was partly attributed to the crystal structure and film orientation, which promoted a layer-by-layer field evaporation. The evaporation behavior of the related ZrTaB2 films was found to be similar to that of ZrB2. The distribution of Ta in relation to Zr was investigated, showing that the column boundaries were both metal- and Ta-rich, and that there was a significant amount of Ta in solid solution within the columns. In addition, an instrumental artefact previously not described in atom probe tomography was found in several of the materials investigated in this thesis. The artefact consists of high-density lines along the analysis direction, which cannot be related to pole artefacts. The detection system of the atom probe was identified as the cause, because the artefact patterns on detector histograms coincided with the structure of the microchannel plate. Inconsistencies in the internal boundaries of the microchannel plate multifibers from the manufacturing process can influence the signal to the detector and locally increase the detection efficiency in a pattern characteristic to the microchannel plate in question. Altogether, this thesis shows that atom probe tomography of nitride and boride thin films is burdened by several artefacts and distortions, but that relevant material outcomes can nevertheless be achieved by informed choices of film isotopic constituents and analytical parameters, exclusion of heavily distorted regions (such as pole artefacts), and the use of compositional correction procedures when applicable.

Nanoinformatics

Nanoinformatics
Author: Isao Tanaka
Publsiher: Springer
Total Pages: 298
Release: 2018-01-15
ISBN 10: 9811076170
ISBN 13: 9789811076176
Language: EN, FR, DE, ES & NL

Nanoinformatics Book Review:

This open access book brings out the state of the art on how informatics-based tools are used and expected to be used in nanomaterials research. There has been great progress in the area in which “big-data” generated by experiments or computations are fully utilized to accelerate discovery of new materials, key factors, and design rules. Data-intensive approaches play indispensable roles in advanced materials characterization. "Materials informatics" is the central paradigm in the new trend. "Nanoinformatics" is its essential subset, which focuses on nanostructures of materials such as surfaces, interfaces, dopants, and point defects, playing a critical role in determining materials properties. There have been significant advances in experimental and computational techniques to characterize individual atoms in nanostructures and to gain quantitative information. The collaboration of researchers in materials science and information science is growing actively and is creating a new trend in materials science and engineering.

Atom Probe Field Ion Microscopy

Atom Probe Field Ion Microscopy
Author: Tien T. Tsong
Publsiher: Cambridge University Press
Total Pages: 400
Release: 2005-09-15
ISBN 10: 9780521019934
ISBN 13: 0521019931
Language: EN, FR, DE, ES & NL

Atom Probe Field Ion Microscopy Book Review:

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy--for example the study of the behavior of single atoms and clusters on a solid surface. The very elegant development of the field ion microscope with the atom-probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

Atom Probe Tomography

Atom Probe Tomography
Author: Simon P. Ringer
Publsiher: Unknown
Total Pages: 112
Release: 2007
ISBN 10: 1928374650XXX
ISBN 13: OCLC:500722625
Language: EN, FR, DE, ES & NL

Atom Probe Tomography Book Review:

Atom Probe Tomography

Atom Probe Tomography
Author: Michael K Miller
Publsiher: Unknown
Total Pages: 264
Release: 2000-07-31
ISBN 10: 9781461542827
ISBN 13: 1461542820
Language: EN, FR, DE, ES & NL

Atom Probe Tomography Book Review:

Atomic Scale Analytical Tomography

Atomic Scale Analytical Tomography
Author: Thomas F. Kelly,Brian P. Gorman,Simon P. Ringer
Publsiher: Cambridge University Press
Total Pages: 300
Release: 2022-03-31
ISBN 10: 1107162505
ISBN 13: 9781107162501
Language: EN, FR, DE, ES & NL

Atomic Scale Analytical Tomography Book Review:

The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.

Analysis Techniques in Atom Probe Tomography

Analysis Techniques in Atom Probe Tomography
Author: Anna Vallarta Ceguerra
Publsiher: Unknown
Total Pages: 203
Release: 2011
ISBN 10: 1928374650XXX
ISBN 13: OCLC:809121248
Language: EN, FR, DE, ES & NL

Analysis Techniques in Atom Probe Tomography Book Review:

Crystal Plasticity Finite Element Methods

Crystal Plasticity Finite Element Methods
Author: Franz Roters,Philip Eisenlohr,Thomas R. Bieler,Dierk Raabe
Publsiher: John Wiley & Sons
Total Pages: 208
Release: 2011-08-04
ISBN 10: 3527642099
ISBN 13: 9783527642090
Language: EN, FR, DE, ES & NL

Crystal Plasticity Finite Element Methods Book Review:

Written by the leading experts in computational materials science, this handy reference concisely reviews the most important aspects of plasticity modeling: constitutive laws, phase transformations, texture methods, continuum approaches and damage mechanisms. As a result, it provides the knowledge needed to avoid failures in critical systems udner mechanical load. With its various application examples to micro- and macrostructure mechanics, this is an invaluable resource for mechanical engineers as well as for researchers wanting to improve on this method and extend its outreach.

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization
Author: Richard Haight,Frances M. Ross,James B. Hannon
Publsiher: World Scientific
Total Pages: 680
Release: 2012
ISBN 10: 9814322849
ISBN 13: 9789814322843
Language: EN, FR, DE, ES & NL

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization Book Review:

As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Handbook of Microscopy for Nanotechnology

Handbook of Microscopy for Nanotechnology
Author: Nan Yao,Zhong Lin Wang
Publsiher: Springer Science & Business Media
Total Pages: 731
Release: 2006-07-12
ISBN 10: 1402080069
ISBN 13: 9781402080067
Language: EN, FR, DE, ES & NL

Handbook of Microscopy for Nanotechnology Book Review:

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Atom Probe Tomography of Aluminium Alloys for Automotive Applications

Atom Probe Tomography of Aluminium Alloys for Automotive Applications
Author: Megan Rose Carter
Publsiher: Unknown
Total Pages: 180
Release: 2017
ISBN 10: 1928374650XXX
ISBN 13: OCLC:1023540698
Language: EN, FR, DE, ES & NL

Atom Probe Tomography of Aluminium Alloys for Automotive Applications Book Review:

Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
Author: David J. Larson,Ty J. Prosa,Robert M. Ulfig
Publsiher: Unknown
Total Pages: 338
Release: 2013-12-31
ISBN 10: 9781461487227
ISBN 13: 1461487226
Language: EN, FR, DE, ES & NL

Local Electrode Atom Probe Tomography Book Review:

Laser Additive Manufacturing

Laser Additive Manufacturing
Author: Milan Brandt
Publsiher: Woodhead Publishing
Total Pages: 498
Release: 2016-09-01
ISBN 10: 0081004346
ISBN 13: 9780081004340
Language: EN, FR, DE, ES & NL

Laser Additive Manufacturing Book Review:

Laser Additive Manufacturing: Materials, Design, Technologies, and Applications provides the latest information on this highly efficient method of layer-based manufacturing using metals, plastics, or composite materials. The technology is particularly suitable for the production of complex components with high precision for a range of industries, including aerospace, automotive, and medical engineering. This book provides a comprehensive review of the technology and its range of applications. Part One looks at materials suitable for laser AM processes, with Part Two discussing design strategies for AM. Parts Three and Four review the most widely-used AM technique, powder bed fusion (PBF) and discuss other AM techniques, such as directed energy deposition, sheet lamination, jetting techniques, extrusion techniques, and vat photopolymerization. The final section explores the range of applications of laser AM. Provides a comprehensive one-volume overview of advances in laser additive manufacturing Presents detailed coverage of the latest techniques used for laser additive manufacturing Reviews both established and emerging areas of application

Atom Probe Tomography of III nitrides

Atom Probe Tomography of III nitrides
Author: Ravi Shivaraman
Publsiher: Unknown
Total Pages: 100
Release: 2013
ISBN 10: 9781303731808
ISBN 13: 1303731800
Language: EN, FR, DE, ES & NL

Atom Probe Tomography of III nitrides Book Review:

Atom Probe Tomography (APT) is a technique that couples time of flight mass spectroscopy with an approximate point projection imaging. The advent of ultra-short duration pulsed-lasers with high optical quality has made rapid acquisition of data from materials with poor electrical conductivity practicable. APT analysis of the III-nitrides based devices has value due to the technological significance of these materials. 3D metrology of the active regions of III-nitride based devices provides insight into their electrical/optical performance. APT analysis of a commercial grade c-plane light emitting diode showed that the indium fluctuations in the active region significantly impacted the device's internal quantum efficiency, droop behavior, and current-voltage curves. Comparative analysis was performed on 20-21 and 20-2-1 Gallium Nitride (GaN)-based semipolar light emitting diodes (emission wavelength ~450 nm) using APT. The quantification of 3D Indium distribution in the single quantum well active region in these devices revealed a higher Indium incorporation in the 20-2-1 GaN light emitting diode single quantum well, consistent with the predicted polarization influenced potential energy landscape in the well. APT analysis of aluminum indium nitride nanostructure grown on Gallium Nitride demonstrated the influence of substrate orientation and growth methodology on nanoscale morphology. Gallium Nitride nanorods were also characterized to analyze the indium incorporation in the Indium gallium nitride quantum wells grown on the nanorods' sidewalls.