Advanced Metrology

Advanced Metrology
Author: X. Jane Jiang,Paul J. Scott
Publsiher: Academic Press
Total Pages: 374
Release: 2020-04-08
ISBN 10: 0128218169
ISBN 13: 9780128218167
Language: EN, FR, DE, ES & NL

Advanced Metrology Book Review:

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software

Advanced Mathematical and Computational Tools in Metrology and Testing IX

Advanced Mathematical and Computational Tools in Metrology and Testing IX
Author: Franco Pavese
Publsiher: World Scientific
Total Pages: 450
Release: 2012
ISBN 10: 9814397946
ISBN 13: 9789814397940
Language: EN, FR, DE, ES & NL

Advanced Mathematical and Computational Tools in Metrology and Testing IX Book Review:

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

Advanced Mathematical And Computational Tools In Metrology And Testing Xi

Advanced Mathematical And Computational Tools In Metrology And Testing Xi
Author: Alistair B Forbes,Anna G Chunovkina,Sascha Eichstadt,Nien Fan Zhang,Franco Pavese
Publsiher: World Scientific
Total Pages: 460
Release: 2018-10-16
ISBN 10: 981327431X
ISBN 13: 9789813274310
Language: EN, FR, DE, ES & NL

Advanced Mathematical And Computational Tools In Metrology And Testing Xi Book Review:

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.

Advanced Metrology

Advanced Metrology
Author: X. Jane Jiang,Paul J. Scott
Publsiher: Academic Press
Total Pages: 320
Release: 2020-04
ISBN 10: 9780128218150
ISBN 13: 0128218150
Language: EN, FR, DE, ES & NL

Advanced Metrology Book Review:

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software

Optical Imaging and Metrology

Optical Imaging and Metrology
Author: Wolfgang Osten,Nadya Reingand
Publsiher: John Wiley & Sons
Total Pages: 502
Release: 2012-09-10
ISBN 10: 3527648461
ISBN 13: 9783527648467
Language: EN, FR, DE, ES & NL

Optical Imaging and Metrology Book Review:

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

Industrial Busines Forum and Measurement Instruments Exhibition in Advanced Metrology

Industrial Busines Forum and Measurement Instruments Exhibition in Advanced Metrology
Author: Anonim
Publsiher: Unknown
Total Pages: 135
Release: 2000
ISBN 10: 1928374650XXX
ISBN 13: OCLC:50835681
Language: EN, FR, DE, ES & NL

Industrial Busines Forum and Measurement Instruments Exhibition in Advanced Metrology Book Review:

The Application of Advanced Metrology Techniques to Ballistics and Toolmark Identification

The Application of Advanced Metrology Techniques to Ballistics and Toolmark Identification
Author: Katie Anne Addinall
Publsiher: Unknown
Total Pages: 135
Release: 2017
ISBN 10: 1928374650XXX
ISBN 13: OCLC:1079223467
Language: EN, FR, DE, ES & NL

The Application of Advanced Metrology Techniques to Ballistics and Toolmark Identification Book Review:

Automotive Engine Metrology

Automotive Engine Metrology
Author: Salah H. R. Ali
Publsiher: CRC Press
Total Pages: 280
Release: 2017-07-06
ISBN 10: 1315341190
ISBN 13: 9781315341194
Language: EN, FR, DE, ES & NL

Automotive Engine Metrology Book Review:

In recent decades, metrology—an accurate and precise technology of high quality for automotive engines—has garnered a great deal of scientific interest due to its unique advanced soft engineering techniques in design and diagnostics. Used in a variety of scientific applications, these techniques are now widely regarded as safer, more efficient, and more effective than traditional ones. This book compiles and details the cutting-edge research in science and engineering from the Egyptian Metrology Institute (National Institute for Standards) that is revolutionizing advanced dimensional techniques through the development of coordinate and surface metrology.

Advanced Nanoscale ULSI Interconnects Fundamentals and Applications

Advanced Nanoscale ULSI Interconnects  Fundamentals and Applications
Author: Yosi Shacham-Diamand,Tetsuya Osaka,Madhav Datta,Takayuki Ohba
Publsiher: Springer Science & Business Media
Total Pages: 552
Release: 2009-09-19
ISBN 10: 0387958681
ISBN 13: 9780387958682
Language: EN, FR, DE, ES & NL

Advanced Nanoscale ULSI Interconnects Fundamentals and Applications Book Review:

In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation of modern electronics system create a strong demand for new and improved electronic circuits as demonstrated by the amazing progress in the ?eld of ULSI technology. This progress is well described by the famous “Moore’s law” which states, in its most general form, that all the metrics that describe integrated circuit performance (e. g. , speed, number of devices, chip area) improve expon- tially as a function of time. For example, the number of components per chip d- bles every 18 months and the critical dimension on a chip has shrunk by 50% every 2 years on average in the last 30 years. This rapid growth in integrated circuits te- nology results in highly complex integrated circuits with an increasing number of interconnects on chips and between the chip and its package. The complexity of the interconnect network on chips involves an increasing number of metal lines per interconnect level, more interconnect levels, and at the same time a reduction in the interconnect line critical dimensions.

Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics
Author: Zhiyong Ma,David G. Seiler
Publsiher: CRC Press
Total Pages: 1454
Release: 2017-03-27
ISBN 10: 135173394X
ISBN 13: 9781351733946
Language: EN, FR, DE, ES & NL

Metrology and Diagnostic Techniques for Nanoelectronics Book Review:

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Advanced Mathematical and Computational Tools in Metrology and Testing X

Advanced Mathematical and Computational Tools in Metrology and Testing X
Author: Franco Pavese,Wolfram Bremser,Anna Chunovkina,Nicolas Fischer,Alistair B Forbes
Publsiher: World Scientific
Total Pages: 448
Release: 2015-04-22
ISBN 10: 9814678635
ISBN 13: 9789814678636
Language: EN, FR, DE, ES & NL

Advanced Mathematical and Computational Tools in Metrology and Testing X Book Review:

This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards. Contents:Fostering Diversity of Thought in Measurement Science (F Pavese and P De Bièvre)Polynomial Calibration Functions Revisited: Numerical and Statistical Issues (M G Cox and P Harris)Empirical Functions with Pre-Assigned Correlation Behaviour (A B Forbes)Models and Methods of Dynamic Measurements: Results Presented by St. Petersburg Metrologists (V A Granovskii)Interval Computations and Interval-Related Statistical Techniques: Estimating Uncertainty of the Results of Data Processing and Indirect Measurements (V Ya Kreinovich)Classification, Modeling and Quantification of Human Errors in Chemical Analysis (I Kuselman)Application of Nonparametric Goodness-of-Fit Tests: Problems and Solution (B Yu Lemeshko)Dynamic Measurements Based on Automatic Control Theory Approach (A L Shestakov)Models for the Treatment of Apparently Inconsistent Data (R Willink)Model for Emotion Measurements in Acoustic Signals and Its Analysis (Y Baksheeva, K Sapozhnikova and R Taymanov)Uncertainty Calculation in Gravimetric Microflow Measurements (E Batista, N Almeida, I Godinho and E Filipe)Uncertainties Propagation from Published Experimental Data to Uncertainties of Model Parameters Adjusted by the Least Squares (V I Belousov, V V Ezhela, Y V Kuyanov, S B Lugovsky, K S Lugovsky and N P Tkachenko)A New Approach for the Mathematical Alignment Machine Tool-Paths on a Five-Axis Machine and Its Effect on Surface Roughness (S Boukebbab, J Chaves-Jacob, J-M Linares and N Azzam)Goodness-of-Fit Tests for One-Shot Device Testing Data (E V Chimitova and N Balakrishan)Calculation of Coverage Intervals: Some Study Cases (A Stepanov, A Chunovkina and N Burmistrova)Application of Numerical Methods in Metrology of Electromagnetic Quantities (M Cundeva-Blajer)Calibration Method of Measuring Instruments in Operating Conditions (A A Danilov, Yu V Kucherenko, M V Berzhinskaya, N P Ordinartseva)Statistical Methods for Conformity Assessment When Dealing with Computationally Expensive Systems: Application to a Fire Engineering Case Study (S Demeyer, N Fischer, F Didieux and M Binacchi)Overview of EMRP Joint Reserch Project NEW06 "Traceability for Computationally-Intensive Metrology" (A B Forbes, I M Smith, F Härtig and K Wendt)Stable Units of Account for Economic Value Correct Measuring (N Hovanov)A Novel Approach for Uncertainty Evaluation Using Characteristic Function Theory (A B Ionov, N S Chernysheva and B P Ionov)Estimation of Test Uncertainty for TraCIM Reference Pairs (F Keller, K Wendt and F Härtig)Approaches for Assigning Numerical Uncertainty to Reference Data Pairs for Software Validation (G J P Kok and I M Smith)Uncertainty Evaluation for a Computationally Expensive Model of a Sonic Nozzle (G J P Kok and N Pelevic)EllipseFit4HC: A MATLAB Algorithm for Demodulation and Uncertainty Evaluation of the Quadrature Interferometer Signals (R Köning, G Wimmer and V Witkovský)Considerations on the Influence of Test Equipment Instability and Calibration Methods on Measurement Uncertainty of the Test Laboratory (A S Krivov, S V Marinko and I G Boyko)A Cartesian Method to Improve the Results and Save Computation Time in Bayesian Signal Analysis (G A Kyriazis)The Definition of the Reliability of Identification of Complex Organic Compounds Using HPLC and Base Chromatographic and Spectral Data (E V Kulyabina and Yu A Kudeyarov)Uncertainty Evaluation of Fluid Dynamic Simulation with One-Dimensional Riser Model by Means of Stochastic Differential Equations (E A O Lima, S B Melo, C C Dantas, F A S Teles and S Soares Bandiera)Simulation Method to Estimate the Uncertainties of ISO Specifications (J-M Linares and J M Sprauel)Adding a Virtual Layer in a Sensor Network to Improve Measurement Reliability (U Maniscalco and R Rizzo)Calibration Analysis of a Computational Optical System Applied in the Dimensional Monitoring of a Suspension Bridge (L L Martins, J M Rebordão and A S Ribeiro)Determination of Numerical Uncertainty Associated with Numerical Artefacts for Validating Coordinate Metrology Software (H D Minh, I M Smith and A B Forbes)Least-Squares Method and Type B Evaluation of Standard Uncertainty (R Palenčár, S Ďuriš, P Pavlásek, M Dovica, S Slosarčík and G Wimmer)Optimising Measurement Processes Using Automated Planning (S Parkinson, A Crampton and A P Longstaff)Software Tool for Conversion of Historical Temperature Scales (P Pavlásek, S Ďuriš, R Palenčár and A Merlone)Few Measurements, Non-Normality: A Statement on the Expanded Uncertainty (J Petry, B De Boeck, M Dobre and A Peruzzi)Quantifying Uncertainty in Accelerometer Sensitivity Studies (A L Rukhin and D J Evans)Metrological Aspects of Stopping Iterative Procedures in Inverse Problems for Static-Mode Measurements (K K Semenov)Inverse Problems in Theory and Practice of Measurements and Metrology (K K Semenov, G N Solopchenko and V Ya Kreinovich)Fuzzy Intervals as Foundation of Metrological Support for Computations with Inaccurate Data (K K Semenov, G N Solopchenko and V Ya Kreinovich)Testing Statistical Hypotheses for Generalized Semiparametric Proportional Hazards Models with Cross-Effect of Survival Functions (M A Semenova and E V Chimitova)Novel Reference Value and DOE Determination by Model Selection and Posterior Predictive Checking (K Shirono, H Tanaka, M Shiro and K Ehara)Certification of Algorithms for Constructing Calibration Curves of Measuring Instruments (T Siraya)Discrete and Fuzzy Encoding of the ECG-Signal for Multidisease Diagnostic System (V Uspenskiy, K Vorontsov, V Tselykh and V Bunakov)Application of Two Robust Methods in Inter-Laboratory Comparisons with Small Samples (E T Volodarsky and Z L Warsza)Validation of CMM Evaluation Software Using TraCIM (K Wendt, M Franke and F Härtig)Semi-Parametric Polynomial Method for Retrospective Estimation of the Change-Point of Parameters of Non-Gaussian Sequences (S V Zabolotnii and Z L Warsza)Use of a Bayesian Approach to Improve Uncertainty of Model-Based Measurements by Hybrid Multi-Tool Metrology (N-F Zhang, B M Barnes, R M Silver and H Zhou)Application of Effective Number of Observations and Effective Degrees of Freedom for Analysis of Autocorrelated Observations (A Zieba) Readership: Researchers, graduate students, academics and professionals in metrology. Key Features:Unique consolidated series of books (started in 1993) in mathematics, statistics and software specifically for metrology and testingAuthors are among the most prominent in the metrology and testing fieldsNo competing books in the same comprehensive fieldKeywords:Mathematics;Statistics;Modeling;Uncertainty;Metrology;Testing;Computational Tools;Measurement Science

Advanced Mathematical Computational Tools in Metrology VII

Advanced Mathematical   Computational Tools in Metrology VII
Author: P. Ciarlini
Publsiher: World Scientific
Total Pages: 363
Release: 2006
ISBN 10: 9812566740
ISBN 13: 9789812566744
Language: EN, FR, DE, ES & NL

Advanced Mathematical Computational Tools in Metrology VII Book Review:

This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Baer et al.); Mereotipological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations Versus Robust Control Charts in Statistical Process Control (M I Gomes & F O Figueiredo); Decision Making Using Sensor's Data Fusion and Kohonen Self Organizing Maps (P S Girao et al.); Generic System Design for Measurement Databases Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gro et al.); Repeated Measurements: Evaluation of Their Uncertainty from the Viewpoints of Classical and Bayesian Statistics (I Lira & W Woger); Detection of Outliers in Interlaboratory Testing and Some Thoughts About Multivariate Precision (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis-A Dialogue (D S Sivia); Validation of a Virtual Sensor for Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Linking GUM and ISO 5725 (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Uncertainty of the Degree of Equivalence in MRA Key Comparisons (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kuhne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology.

Advanced Mathematical and Computational Tools in Metrology VI

Advanced Mathematical and Computational Tools in Metrology VI
Author: P Ciarlini,M G Cox,F Pavese,G B Rossi
Publsiher: World Scientific
Total Pages: 368
Release: 2004-07-09
ISBN 10: 9814482412
ISBN 13: 9789814482417
Language: EN, FR, DE, ES & NL

Advanced Mathematical and Computational Tools in Metrology VI Book Review:

This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia “G. Colonnetti” (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology. The proceedings have been selected for coverage in: Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)CC Proceedings — Engineering & Physical Sciences Contents:Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain (P Ciarlini & M L Lo Cascio)Least Squares Adjustment in the Presence of Discrepant Data (M G Cox et al.)Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing (C Perruchet)Compound-Modelling of Metrological Data Series (F Pavese)Validation of Calibration Methods — A Practical Approach (E Filipe)A Hybrid Method for (ℓ1 Approximation (D Lei & J C Mason)A New Off-Line Gain Stabilisation Method Applied to Alpha-Particle Spectrometry (S Pommé & G Sibbens)Development of Software for ANOVA that Can Generate Expressions of Variance Expectations (H Tanaka et al.)Short Course on Uncertainty Evaluation (M G Cox)Software Requirements in Legal Metrology: Short Course Held Adjacent to the Conference (D Richter)and other articles Readership: Researchers, graduate students, academics, professionals and industrialists in metrology. Keywords:Metrology;Measurement Science;Statistics;Software ToolsKey Features:Promotes effective mathematical and computational tools in metrologyClarifies the modelling, statistical and computational requirements in metrologyAssists young researchers in metrology and related fieldsAddresses industrial requirements

Advanced Metrology for the Development of Nature inspired Polymer Electrolyte Fuel Cells

Advanced Metrology for the Development of Nature inspired Polymer Electrolyte Fuel Cells
Author: Viswanath Sasank Bethapudi
Publsiher: Unknown
Total Pages: 135
Release: 2021
ISBN 10: 1928374650XXX
ISBN 13: OCLC:1255870840
Language: EN, FR, DE, ES & NL

Advanced Metrology for the Development of Nature inspired Polymer Electrolyte Fuel Cells Book Review:

Fringe 2013

Fringe 2013
Author: Wolfgang Osten
Publsiher: Springer Science & Business Media
Total Pages: 976
Release: 2013-08-15
ISBN 10: 3642363598
ISBN 13: 9783642363597
Language: EN, FR, DE, ES & NL

Fringe 2013 Book Review:

In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution) - Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time) - High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano) - Hybrid technologies in Optical Imaging and Metrology (hybrid optics, sensor and data fusion, model-based solutions, multimodality) - New optical sensors, imaging and measurement systems (integrated, miniaturized, in-line, real-time, traceable, remote) Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.

Advanced Mathematical and Computational Tools in Metrology V

Advanced Mathematical and Computational Tools in Metrology V
Author: P Ciarlini,M G Cox,E Filipe,F Pavese,D Richter
Publsiher: World Scientific
Total Pages: 392
Release: 2001-03-09
ISBN 10: 981449190X
ISBN 13: 9789814491907
Language: EN, FR, DE, ES & NL

Advanced Mathematical and Computational Tools in Metrology V Book Review:

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools. Contents:Discrete B-Splines Approximation in a Variety of Norms (I J Anderson & D A Turner)Local and Global Calibration of Coordinate Measuring Machines (S D Antunes et al.)Interactive Bootstrap Computing on the Internet (P Ciarlini et al.)Use of Monte Carlo Simulation for Uncertainty Evaluation in Metrology (M G Cox et al.)Assessment of Current Methods of Analysis for Quantitative In-Vivo Magnetic Resonance Spectroscopy (C Elster et al.)The Mutual Recognition Arrangement (MRA) — Recognizing National Traceability (E Filipe)Self-Calibration and Error Separation in Metrology (A B Forbes & I M Smith)Mathematical Model Adequacy in Metrology: Step-by-Step Approach (V A Granovsky & T N Siraya)Databases in Metrology: Requirements and Solutions (V Hartmann et al.)Tools for Quality Testing of Batches of Artifacts: The Cryogenic Thermometers for the LHC (D Ichim et al.)Bayesian Approaches to Data Fusion in Metrology (G P Kelly)Estimators for Key Comparison Reference Values (R Köhler)An Algorithm for On-Line Outlier Rejection by Sequence Analysis in Data Acquisition (F Pavese et al.)and other papers Readership: Researchers in metrological institutes, universities (measurement science) and industries (quality systems, calibration, certification). Keywords:Caparica (Portugal);Proceedings;Workshop;Metrology

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology
Author: Alain C. Diebold
Publsiher: CRC Press
Total Pages: 896
Release: 2001-06-29
ISBN 10: 0203904540
ISBN 13: 9780203904541
Language: EN, FR, DE, ES & NL

Handbook of Silicon Semiconductor Metrology Book Review:

Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay

Advanced Mathematical and Computational Tools in Metrology VII

Advanced Mathematical and Computational Tools in Metrology VII
Author: Anonim
Publsiher: Unknown
Total Pages: 135
Release: 2022
ISBN 10: 9814478504
ISBN 13: 9789814478502
Language: EN, FR, DE, ES & NL

Advanced Mathematical and Computational Tools in Metrology VII Book Review:

Advanced Mathematical and Computational Tools in Metrology IV

Advanced Mathematical and Computational Tools in Metrology IV
Author: P Ciarlini,A B Forbes,F Pavese,D Richter
Publsiher: World Scientific
Total Pages: 336
Release: 2000-01-22
ISBN 10: 9814493635
ISBN 13: 9789814493635
Language: EN, FR, DE, ES & NL

Advanced Mathematical and Computational Tools in Metrology IV Book Review:

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools. Contents:An Efficient Algorithm for Template Matching (I J Anderson et al.)An Application of Bootstrap Regression to Metrological Data with Errors in Both Variables (P Ciarlini & G Regoliosi)Evaluation of Lateral Shearing Interferograms (C Elster)Fusing Prior Calibration Information in Metrology Data Analysis (A B Forbes)Software Engineering Related Standards and Guidelines for Metrology (N Greif & D Richter)Virtual Testing: Interaction with a Composite Model Using the Internet (N J McCormick)Mathematical Problems in the Definition of Standards Based on Scales: The Case of Temperature (F Pavese)Discussion of Methods for the Assessment of Uncertainties in Monte Carlo Particle Transport Calculations (B R L Siebert)Some Robust Methods for Fitting Parametrically Defined Curves or Surfaces to Measured Data (G A Watson)and other papers Readership: Researchers in metrological institutes, universities (measurement science and industries (quality systems, calibration, certification). Keywords:Mathematical Tools;Computational Tools;Metrology;Workshop;Proceedings

Machine Tool Metrology

Machine Tool Metrology
Author: Graham T. Smith
Publsiher: Springer
Total Pages: 685
Release: 2016-04-06
ISBN 10: 3319251090
ISBN 13: 9783319251097
Language: EN, FR, DE, ES & NL

Machine Tool Metrology Book Review:

Maximizing reader insights into the key scientific disciplines of Machine Tool Metrology, this text will prove useful for the industrial-practitioner and those interested in the operation of machine tools. Within this current level of industrial-content, this book incorporates significant usage of the existing published literature and valid information obtained from a wide-spectrum of manufacturers of plant, equipment and instrumentation before putting forward novel ideas and methodologies. Providing easy to understand bullet points and lucid descriptions of metrological and calibration subjects, this book aids reader understanding of the topics discussed whilst adding a voluminous-amount of footnotes utilised throughout all of the chapters, which adds some additional detail to the subject. Featuring an extensive amount of photographic-support, this book will serve as a key reference text for all those involved in the field.